Great news for everyone who keeps a finger on the pulse of domestic radioelectronics and high technologies. The jubilee 10th issue of the scientific and technical journal “STEK-V” has gone on sale on the OZON marketplace.
The editorial board of the magazine, published by JSC “NIIET” (part of the Element Group of Companies, MOEX: ELMT), has collected materials in the 10th issue dedicated to the development and production of electronic technology. We talk about the main topics:
• The issue opens with an interview with the Director General of JSC “NIIET” Pavel Kutsko — “I want to move from the stage of formation to the stage of prosperity.” In it, he summarizes the results of many years of the enterprise’s work and analyzes the challenges facing Russian microelectronics. In the spotlight are the effectiveness of state support measures, mechanisms for stimulating demand for the domestic electronic component base, as well as the development of projects on the RISC-V architecture and technologies based on gallium nitride.
In the material by D. M. Kiryanov and D. G. Bormotov, “Stages of Microelectronic Production and the Role of Measurement Control at Various Stages of the Technological Process,” the entire path of creating microelectronic products is examined in detail — from wafer preparation and probe control to packaging and final testing. The authors show what role measurement control plays in ensuring product quality and at which stages of the technological process the most critical risks arise.
• The article by scientists of the National Academy of Sciences of Belarus, A. I. Belous and Yu. S. Usherenko, is dedicated to current approaches to protecting technical and biological objects from electromagnetic radiation. The authors consider a wide range of issues: from the electromagnetic safety of household appliances and transport for humans to increasing the resistance of spacecraft and electronics to impulse threats (including electromagnetic weapons).
In this issue, readers will be introduced to a study by students from the Faculty of Physics at VSU, focusing on the capabilities of ultrasoft X-ray emission spectroscopy in analyzing thin films of molybdenum-silicon silicides. The conducted phase analysis revealed the presence of and phases, and the obtained results confirmed the effectiveness of the method for studying the phase composition of thin-film materials and its potential for materials science research.
• Particular attention should be paid to the work of graduates from the Faculty of Computer Science and Technology at the Voronezh State University of Forestry and Technologies named after G.F. Morozov, dedicated to the development of an automated quality control system for integrated circuits based on convolutional neural networks.
Order the 10th issue on OZON (simply enter “journal STEK-V” in the marketplace search bar), implement the advanced experience of your colleagues, and become the authors of future issues!
